During 2019, members of the P2654 group have contributed papers and presentations for a number of technical conferences. Some of these presentations are now available for you to view or download.
AutoTestCon 2019 (National Harbor, MaryLand):
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How Military and Aerospace Systems Can Benefit from System Test Access Management (STAM) Using IEEE-P2654 (presentation, PDF)
International Test Conference 2019 (Washington, DC):
- P2654 Poster (PDF)
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How IEEE P1687.1 and IEEE P2654 can cooperate to access on-chip instruments during system assembly test (slides only, PDF)
- How IEEE P1687.1 and IEEE P2654 can cooperate to access on-chip instruments during system assembly test (small format slides with notes, PDF)
You are free to share these presentations but please credit sjtag.org or the P2654 Working Group.