SJTAG

SJTAG Newsletter
http://www.sjtag.org

 

Issue 23 - Q1-2013

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From the Chair

Your SJTAG newsletter is coming to you a little later than intended this quarter. Our web hosting service upgraded our server configuration on January 28 just as we were about to go to press which had the side effect of knocking our emailer out of action along with some parts of our website, and it took a few days to figure out what had gone wrong.

We're delighted to report that the website is now fully operational again and we are even looking forward to providing a faster and even more reliable service through our website in the future.

http://www.sjtag.org/


Board Assisted BIST

This month we are starting off a new feature in our newsletter to highlight important activities that are happening in industry regarding the subject of System JTAG. This month we want to highlight a new effort aimed at standardizing Built-In Self-Test (BIST) as it relates to testing at the board and system level application. This effort is organized by the International Electronics Manufacturing Initiative (iNEMI) and involves expanding the issues identified by the IEEE P1687 IJTAG and IEEE 1500 work for devices, but at the board and system level. This new group is part of an on-going investigation on this subject. The complete iNEMI project is broken down into four targeted investigation phases that are described by the Statement of Work (SOW) as:

  1. Survey on BIST availability, usage, access at the board level test (Phase 1 complete)
  2. BIST Use Case Investigation Project (Phase 2 complete) Investigate and identify a "use case" to use as discussion, modeling, and development material. Also identify main users of board BIST, definition for board BIST, and its value-add.
  3. BIST Use Case Function Classification Project (Phase 3 on-going) Investigate and identify for the "use case" as defined in the iNEMI BIST Investigation Project (Phase 2) the tasks, tests, logic and features required and the access, control and vectors available.
  4. Board Level Test Recommendations for Standardization of Component BIST (Phase 4). For the "use case" defined in Phase 3 (Phase 4) define standardized board level language. Feasibility study including IEEE 1687 IJTAG, IEEE Standard Test Access Port Boundary-Scan Architecture 1149.x, and IEEE 1500 Standard for Embedded Core Test (SECT).

The current activity is Phase 3 of the four phase project titled: Built-In Self-Test (BIST) Project, Phase 3 Short-Term and Long-Term Strategies for Use Case Standardization. Phase 2 concluded with the following two "use-cases" to use as the focus for further discussion:

  1. the ability of BIST to test the interfaces between two adjacent ASICs
  2. the ability of BIST to test from an ASIC to external memory interfaces

Initially, the trials will be implemented using FPGA technology instead of ASICs to allow for easy prototyping.

This group has defined a new term to describe the activities of board level BIST as BA-BIST (Board-Assistance BIST). Board-Assistance BIST (Built-In Self-Test) is an embedded capability within an IC that is fully or partially self-contained, in that it incorporates some or all of the following capabilities:

  • Pattern/signal generation
  • Pattern/signal delivery
  • Response or data capture
  • Response evaluation functions

This group has already been successful at identifying the main users of this technology as well as several value-added justifications supporting the need for this technology. There are a few members from the SJTAG group that are also members of this iNEMI activity.

We would encourage you to add your comments and thoughts on this subject on a special SJTAG forum dedicated to this subject. The forum can be found at: iNEMI BIST Project, Phase 3. The information posted will aid in the iNEMI effort as the group moves forward with the project. Please visit the iNEMI project page for more details at: iNEMI BIST Project.

http://forums.sjtag.org/viewtopic.php?f=3&t=174
http://www.inemi.org/project-page/built-self-test-bist-program


Next Newsletter

The Q2-2013 edition of this newsletter will be published towards the end of April 2013. Copies of past newsletters are always available on the SJTAG website.

http://www.sjtag.org/newsletters.html


News from the website

A selection of recent RSS/ATOM news items from the website:

Meeting Minutes from January 14th (Issued: Fri, 01 February 2013 21:36:00 GMT)

The minutes from the weekly meeting held on January 14th, 2013 have now been published. Brief meeting discussing Newsletter.

URL: http://www.sjtag.org/minutes/minutes130114.html


Meeting Minutes from January 7th (Issued: Sat, 26 January 2013 19:16:00 GMT)

The minutes from the weekly meeting held on January 7th, 2013 have now been published. Featured discussions: a. Product lifecycle with Structural Test, Configuration/Tuning/Instrumentation and Software Debug.

URL: http://www.sjtag.org/minutes/minutes130107.html


Meeting Minutes from December 17th (Issued: Wed, 09 January 2013 18:24:00 GMT)

The minutes from the weekly meeting held on December 17th, 2012 have now been published. Featured discussions: a. Consideration of what constitutes the product lifecycle for SJTAG purposes.

URL: http://www.sjtag.org/minutes/minutes121217.html


Meeting Minutes from December 10th (Issued: Mon, 17 December 2012 21:12:00 GMT)

The minutes from the weekly meeting held on December 10th, 2012 have now been published. Featured discussions: a. Consideration of 'layers' as they relate to Harrison's table and Brad's cube model.

URL: http://www.sjtag.org/minutes/minutes121210.html


Meeting Minutes from December 3rd (Issued: Mon, 10 December 2012 22:45:00 GMT)

The minutes from the weekly meeting held on December 3rd, 2012 have now been published. Featured discussions: a. Consideration of 'layers' as they relate to Harrison's table and Brad's cube model.

URL: http://www.sjtag.org/minutes/minutes121203.html


Meeting Minutes from November 26th (Issued: Sun, 09 December 2012 21:08:00 GMT)

The minutes from the weekly meeting held on November 26th, 2012 have now been published. Featured discussions: a. Future format of the SJTAG Newsletter, b. Consideration of 'layers' as they relate to Harrison's table and Brad's cube model.

URL: http://www.sjtag.org/minutes/minutes121126.html