Minutes of Study Group Meeting, 2018-06-25

Meeting called to order: 11:08 AM EDT

The slide references relate to the pack used during this meeting, located here: http://files.sjtag.org/StudyGroup/SG_Meeting_40.pdf

Brad shared the slides for this meeting as Ian was unable to connect to the online WebEx session.

Brad moved to accept the agenda as proposed, seconded by Terry.

1. Roll Call

Ian McIntosh (Leonardo)
Heiko Ehrenberg (GOEPEL Electronics)
Eric Cormack (DFT Solutions)
Terry Duepner (National Instruments)
Brian Erickson (JTAG Technologies)
Peter Horwood (Firecron Ltd.)
Bill Huynh (Marvell Inc.)
Joel Irby (ARM)
Adam W. Ley (ASSET Intertech)
Richard Pistor (Curtiss-Wright)
Jon Stewart (Dell)
Brad Van Treuren (Nokia)
Carl Walker (Cisco Systems)
Louis Ungar (ATE Solutions)
Sivakumar Vijayakumar (Keysight)
Gregory Zucaro (NAVAIR Lakehurst)

By email (non-attendees):
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Excused:
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2. IEEE Patent Slides

  • {Slides 5-9}
  • Patent slides reviewed, no comments.

3. Review and Approve Previous Minutes

  • {Slide 10}
  • June 18 (draft circulated June 18)
    • No corrections noted.
    • Brian moved to approve, Eric seconded.
    • No objections or abstentions → minutes approved.

4. Review Open Action Items

  • {Slide 11}
  • [21.1] Brad: Supply Ian with glossary definitions used by 1687.1 for "transformation" and "retargeting".
    • No updates.
    • ONGOING.
  • [27.2] Legacy Initiative Group to propose definition for "SJTAG".
    • No updates.
    • ONGOING
  • These may need to be carried over to a future Working Group.

5. Discussion Topics

a) Text for Stakeholders.

  • {Slide 12}
  • Refer to forum discussion, http://forums.sjtag.org/viewtopic.php?f=3&t=788.
  • "Test developers was felt to be fully embraced within "designers and maintainers of electronics" so text had been rearranged that way.
  • Brad moved to accept the text as shown under "Proposal (amended)", seconded by Terry, no objections or abstentions → motion carried.

b) Proposed amendments to Scope, Purpose, Need.

  • {Slide 13}
  • Predominantly the updates suggested by Adam Ley.
  • Scope {Slide 14}.
  • Proposed amendment uses the revised text offered by Adam on the forums along with Ian's suggested clarification on "transformations". No further suggestions.
  • Terry moved to accept the amendment to Scope as proposed, seconded by Eric, no objections or abstentions → motion carried.
  • Purpose {Slide 15}.
  • Brad highlighted changes in a copy of the slides {shared}.
  • Proposed amendment changes "Generators" to "Generation" (referring to ATPG) and changes "provide" to "facilitate". Reasoning for the latter is that the means is not actually provided by the standard but facilitated by the standard.
  • Terry moved to accept the amendment to Purpose as proposed, seconded by Eric, no objections or abstentions → motion carried.
  • Need {Slide 16}.
  • Proposed amendment adds hyphens in compound adjectives. "Run-time" may not correctly use a hyphen but it was agreed to leave it as is.
  • Terry moved to accept the amendment to Purpose as proposed, seconded by Jon, no objections or abstentions → motion carried.
  • Additional item raised on the title for the PAR/standard: Following last week's discussion where it was mentioned that the title might help give the reader some initial context, was there value in being more descriptive in the title, e.g. "Standard for management of test access for systems and sub-systems". Apart from bringing in the aspect of sub-systems, the original System Test Access Management is probably adequate if a little vague; gives an acronym than can be "spoken" (STAM).
  • Other suggestions:
    • Standard for system test access, control and knowledge (STACK).
    • Standard for system test access management (STAM) to enable access to sub-system test capabilities from higher architectural levels.
  • Noted that is some perspectives "going higher" might actually mean delving deeper into the hierarchy rather than the other way round.
  • Brad moved to adopt "Standard for system test access management (STAM) to enable access to sub-system test capabilities from higher architectural levels" as the title, seconded by Joel. One abstention noted and one objection on the basis that including "diagnosis" somewhere in the title had not been given sufficient consideration during the discussion. {No result called on the vote as further discussion immediately took place}
  • May be a tendency to keep with simple: The more vague form (simply "STAM") is an aggregation of the four main keywords and tends not to imply any artificial restriction. Is anything precluded by the longer form? Some may see "access" and think "OK access is important, but there are more important things for me" and so not read further. Want to get people to read on into the scope etc.  Concern that STAM on its own might suggest just accessing test result data.
  • Suggestion revised to "Standard for system test access management (STAM) to enable use of sub-system test capabilities at higher architectural levels". Brad revised his motion to refer to this version of the title, again seconded by Joel. One objection (as previously), no abstentions → motion carried.
  • Modified slides created by Brad are available here: http://files.sjtag.org/StudyGroup/SG_Meeting_40_bgvt.pdf.

6. Today's Key Takeaways

  • {Slide 17}
  • Votes taken to approve amended texts and title.

7. Glossary Terms from This Meeting

  • None.
  • Carried over:
    • "Interface" is missing.
      • No obvious IEEE accepted definition.
      • 1687 has definitions for specialised forms: Device Interface and Instrument Interface.
      • We may need specialised forms for Software Interface and Hardware Interface.
    • 1687.1: Transformation, Retargetting.
    • IEEE 1856: Sense - "Sensor" done, Acquire, Analyze not really defined.
    • SJTAG: Discussion on forums - http://forums.sjtag.org/viewtopic.php?f=3&t=782
    • Device - do we mean a packaged device? May be many devices in a package (1149.1 opted for "entity" in order to be non-specific).
      • Correction to the above remark: It has been pointed out that 1149.1 actually defines conformance in terms of "component" (c.f. COMPONENT_CONFORMANCE attribute in BSDL), and "entity" only pertains to BSDL where it is simply inherited from VHDL. "Device" is often used as a modifier, e.g. "device package", "device identification".

8. Topic for next meeting

  • Verification of PAR.
  • Study Group Report (see AOB).

9. Schedule next meeting

  • July 2.
    • This is effectively the last "study group" meeting and we will need to confirm the PAR and supporting material.
    • Jon will be absent.

10. Reminders

11. Any Other Business

  • A study group report needs to be supplied to TTSC to accompany the PAR (see minutes of 4th meeting: http://www.sjtag.org/minutes/study-group-minutes/473-study-group-minutes-2017-09-11). This should be circulated to the group before the next meeting.
  • Heiko has drafted an abstract for a poster at ITC - it's rather broad but we should have something more specific to say by the time we need to prepare the poster itself.

12. List New Action Items

  • None.

13. Adjourn

  • Brad moved to adjourn, seconded by Terry.
  • Meeting adjourned at 12:02 PM EDT

Respectfully submitted,
Ian McIntosh